A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple
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Fecha
2012-11-12
Autores
Lazo-Cortés, Manuel
Sánchez-Díaz, Guillermo
Piza-Dávila, Hugo I.
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Editor
Taylor & Francis Online
Resumen
Descripción
In this paper, we introduce a fast implementation of the CT EXT algorithm for testor property identification, that is based on an accumulative binary tuple. The fast implementation of the CT EXT algorithm (one of the fastest algorithms reported), is designed to generate all the typical testors from a training matrix, requiring a reduced number of operations. Experimental results using this fast implementation and the comparison with other state-of-the-art algorithms that generate typical testors are presented.
Palabras clave
Feature Selection, Typical Testors, Pattern Recognition, Logical Combinatorial Pattern Recognition
Citación
Sánchez-Díaz, G.; Lazo-Cortés, M., y Piza-Dávila H.I. (2012). “A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple”. En International Journal of Computational Intelligence Systems, Volume 5.