Rayas-Sánchez, José E.Chávez-Hurtado, José L.Brito-Brito, Zabdiel2016-03-022016-03-022014-10Chávez-Hurtado, J.L.; Rayas-Sánchez,E. and Brito-Brito, Z. “Reliable full-wave EM simulation of a single-layer SIW interconnect with transitions to microstrip lines,” in COMSOL Conf., Boston, MA, Oct. 2014, pp. 1-5. (DOI: 10.13140/RG.2.1.2579.1445).DOI: 10.13140/RG.2.1.2579.1445http://hdl.handle.net/11117/3131We present a procedure to obtain reliable EM responses for a substrate integrated waveguide (SIW) interconnect with microstrip line transitions. The procedure focuses on two COMSOL configuration settings: meshing sizes and simulation bounding box. Once both are properly configured, the implemented structure is tested by perturbing the simulation bounding box to assure it has no effect on the EM responsesengSimulation Bounding BoxMeshing SchemeSIWMicrostrip LineInterconnectEM Simulationinfo:eu-repo/semantics/conferencePaper