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EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping
(IEEE MTT-S International Microwave Symposium, 2006-06)
EM-based Monte Carlo analysis and yield prediction of microwave circuits using linear-input neural-output space mapping
(IEEE Trans. Microwave Theory Tech.;54, 2006-12)
Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction
(International Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization, 2006-11)