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EM-based Statistical Analysis and Yield Optimization using Space Mapping Based Neuromodels

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dc.contributor.author Rayas-Sánchez, José E.
dc.contributor.author Bandler, John W.
dc.contributor.author Zhang, Qi J.
dc.date.accessioned 2013-05-20T17:19:18Z
dc.date.available 2013-05-20T17:19:18Z
dc.date.issued 2001
dc.identifier.citation J. W. Bandler, J. E. Rayas-Sánchez and Q. J. Zhang, “EM-based statistical analysis and yield optimization using space mapping based neuromodels,” in Micronet Annual Workshop, Ottawa, ON, Apr. 2001, pp. 69-70. es
dc.identifier.uri http://hdl.handle.net/11117/568
dc.description Accurate yield optimization and statistical analysis of microwave components are crucial in manufacturabilitydriven designs in a time-to-market development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full wave electromagnetic (EM) simulations does not appear feasible. Here, an efficient procedure to realize EM-based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. We have mathematically formulated the yield optimization problem using SM-based neuromodels. A general equation to express the relationship between the fine and coarse model sensitivities through a nonlinear, frequency-sensitive neuromapping has been found. We illustrate our technique by the yield analysis and optimization of an HTS filter. Here we assume symmetric variations in the physical parameters due to tolerances. Efficient procedures have also been developed for the asymmetric case. es
dc.description.sponsorship ITESO, A.C. es
dc.language.iso eng es
dc.publisher Micronet Annual Workshop es
dc.relation.ispartofseries Micronet Annual Workshop;2001
dc.rights.uri http://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf es
dc.subject Microwave Circuits es
dc.subject Electromagnetic Based Design es
dc.subject Space Mapping es
dc.subject Neural Networks es
dc.title EM-based Statistical Analysis and Yield Optimization using Space Mapping Based Neuromodels es
dc.type info:eu-repo/semantics/conferencePaper es
rei.revisor Micronet Annual Workshop
rei.peerreviewed Yes es


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