Show simple item record

dc.contributor.authorRayas-Sánchez, José E.
dc.contributor.authorBandler, John W.
dc.date.accessioned2013-05-21T15:23:13Z
dc.date.available2013-05-21T15:23:13Z
dc.date.issued2002-04
dc.identifier.citationJ. E. Rayas-Sánchez and J.W. Bandler, “Statistical design of high frequency electronic circuits using space mapping-based neuromodels,” in VIII International Workshop Iberchip (IWS 2002), Guadalajara, Mexico, Apr. 2002.es
dc.identifier.urihttp://hdl.handle.net/11117/584
dc.descriptionManufacturability-driven designs in a time-to-market development industrial environment demand accurate yield optimization and statistical analysis of the electronic components. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Full wave electromagnetic simulations are usually needed to accurately characterize high frequency electronic circuits. Performing direct yield optimization using accurate full wave electromagnetic simulations for high frequency circuits does not appear feasible. In this paper, an efficient procedure to perform electromagnetics-based yield optimization and statistical analysis of high frequency structures using space mapping-based neuromodels is proposed. Our technique is illustrated by the EM-based statistical analysis and yield optimization of an HTS filter.es
dc.description.sponsorshipITESO, A.C.es
dc.description.sponsorshipNatural Sciences and Engineering Research Council of Canadaes
dc.description.sponsorshipConsejo Nacional de Ciencia y Tecnologíaes
dc.language.isoenges
dc.publisherVIII International Workshop Iberchipes
dc.relation.ispartofseriesVIII International Workshop Iberchip (IWS);2002
dc.rights.urihttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdfes
dc.subjectMicrowave Circuitses
dc.subjectElectromagnetic Based Designes
dc.subjectFull Wave Electromagnetic Simulationses
dc.titleStatistical Design of High Frequency Electronic Circuits Using Space Mapping-Based Neuromodelses
dc.typeinfo:eu-repo/semantics/conferencePaperes
rei.revisorVIII International Workshop Iberchip
rei.peerreviewedYeses


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record