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dc.contributor.authorRayas-Sánchez, José E.
dc.contributor.authorGutiérrez-Ayala, Vladimir
dc.date.accessioned2013-05-21T17:03:31Z
dc.date.available2013-05-21T17:03:31Z
dc.date.issued2006-06
dc.identifier.citationJ. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping,” in IEEE MTT-S Int. Microwave Symp. Dig., San Francisco, CA, Jun. 2006, pp. 1597-1600. (ISSN: 0149-645X; E-ISBN: 0-7803-7542-5; P-ISBN: 0-7803-9541-7; INSPEC: 9098190; DOI: 10.1109/MWSYM.2006.249641)es
dc.identifier.urihttp://hdl.handle.net/11117/596
dc.descriptionWe propose a method for highly accurate electromagnetics-based statistical analysis and yield calculations around a space mapped nominal solution for RF and microwave circuits. Our method consists of applying a constrained Broyden-based linear input mapping approach to design, followed by an output neural mapping modeling process in which not only the responses but the design parameters and independent variable are used as inputs to the output neural network. We illustrate the accuracy of our technique using a classical synthetic problem.es
dc.description.sponsorshipITESO, A.C.es
dc.description.sponsorshipConsejo Nacional de Ciencia y Tecnologíaes
dc.language.isoenges
dc.publisherIEEE MTT-S International Microwave Symposiumes
dc.relation.ispartofseriesIEEE MTT-S International Microwave Symposium;2006
dc.rights.urihttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdfes
dc.subjectNeural Space Mapping (NSM)es
dc.subjectElectromagnetic Based Designes
dc.subjectBroyden-Based Linear Input Mappinges
dc.subjectElectromagnetic Based Yield Predictiones
dc.titleEM-based statistical analysis and yield estimation using linear-input and neural-output space mappinges
dc.typeinfo:eu-repo/semantics/conferencePaperes
rei.revisorIEEE MTT-S International Microwave Symposium
rei.peerreviewedYeses


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