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EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect

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dc.contributor.author Rayas-Sánchez, José E.
dc.contributor.author Gutiérrez-Ayala, Vladimir
dc.date.accessioned 2013-05-21T17:56:51Z
dc.date.available 2013-05-21T17:56:51Z
dc.date.issued 2008-02
dc.identifier.citation J. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect,” in 9th IEEE Latin-American Test Workshop (LATW 2008), Puebla, Mexico, Feb. 2008, pp. 145-150. es
dc.identifier.uri http://hdl.handle.net/11117/598
dc.description An electromagnetics (EM)-based parametric optimization of a microstrip to substrate integrated waveguide (SIW) transition is described in this work. We study the waveguide length effects over the reflection coefficient in order to find a suitable SIW surrogate model. We perform a parametric optimization of this surrogate model. Finally, we simulate the original full-length SIW interconnect with microstrip transitions at the optimal surrogate model solution, confirming a significant improvement not only in the reflections but also in the transmission. Both the SIW interconnect and its surrogate model are simulated using a commercially available full-wave EM simulator. es
dc.description.sponsorship ITESO, A.C. es
dc.description.sponsorship Consejo Nacional de Ciencia y Tecnología es
dc.language.iso eng es
dc.publisher 9th IEEE Latin-American Test Workshop es
dc.relation.ispartofseries 9th IEEE Latin-American Test Workshop (LATW);2008
dc.rights.uri http://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf es
dc.subject SIW es
dc.subject Hardened Interconnects es
dc.subject Electromagnetic Based Optimization es
dc.subject Parametric Optimization es
dc.subject Microstrip-to-SIW Transitions es
dc.subject Substrate Integrated Waveguide (SIW) es
dc.title EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect es
dc.type info:eu-repo/semantics/conferencePaper es
rei.revisor 9th IEEE Latin-American Test Workshop
rei.peerreviewed Yes es


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