Bandler, John W.Rayas-Sánchez, José E.Zhang, Qi J.2013-05-202013-05-202002-01J.W. Bandler, J.E. Rayas-Sánchez and Q.J. Zhang, “Yield-driven electromagnetic optimization via space mapping-based neuromodels,” Int. J. RF and Microwave CAE, vol. 12, pp. 79-89, Jan. 2002.1096-4290http://hdl.handle.net/11117/573Accurate yield optimization and statistical analysis of microwave components are crucial ingredients for manufacturability-driven designs in a time-to-market development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full-wave electromagnetic simulations does not appear feasible. In this article, an efficient procedure to realize electromagnetics (EM) based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. Our technique is illustrated by the EM-based statistical analysis and yield optimization of a high temperature superconducting (HTS) microstrip filter.engNeural Network ApplicationsOptimization MethodsDesign AutomationStatistical AnalysisYield OptimizationDesign CenteringMicrowave CircuitsMicrostrip FiltersNeural ModelingNeural Space Mapping (NSM)Electromagnetic Based Optimizationinfo:eu-repo/semantics/article