Rayas-Sánchez, José E.2013-05-212013-05-212006-11J. E. Rayas-Sánchez, “Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction,” in Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization (SMSMEO-06), Lyngby, Denmark, Nov. 2006.http://hdl.handle.net/11117/597Statistical analysis and yield estimation of high-frequency electronic circuits are critical steps for manufacturability-driven design. Accurate yield prediction typically requires massive amounts of computationally intensive high-fidelity simulations, such as full-wave electromagnetic (EM) simulations, to cover the entire statistic of possible outcomes of a given manufacturing process.engYield EstimationHigh-frequency Electronic CircuitsElectromagnetic Based Designinfo:eu-repo/semantics/conferencePaper