DESI - Artículos y ponencias sin arbitraje

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Equalization Tuning of the PCIe Physical Layer by Using Machine Learning in Industrial Post-silicon Validation

Rangel-Patiño, Francisco E.; Viveros-Wacher, Andres; Rajyaguru, Chintan; Vega-Ochoa, Edgar A.; Rodriguez-Saenz, Sofia D.; Silva-Cortes, Johana L.; Shival, Hemanth; Rayas-Sánchez, José E. (IEEE, 2023-06-14)
PCIe Gen5 Physical Layer Equalization Tuning by Using K-means Clustering and Gaussian Process Regression Modeling in Industrial Post-silicon Validation

Rangel-Patiño, Francisco E.; Viveros-Wacher, Andres; Rajyaguru, Chintan; Vega-Ochoa, Edgar A.; Rodriguez-Saenz, Sofia D.; Silva-Cortes, Johana L.; Shival, Hemanth; Rayas-Sánchez, José E. (IEEE, 2023-06-30)
TC-2 Design Automation Committee—On the Future of RF and Microwave Design Automation—2022

Gibiino, Gian Piero; Rayas-Sánchez, José E.; Pirola, Marco; Khazaka, Roni; Zhang, Qi-Jun; Root, David E.; Bandler, John W. (IEEE, 2022-10-04)
The MTT-S Education Committee–Promoting education for all–2022

Che, Wenquan; Mansour, Raafat; Gong, Xun; Rayas-Sánchez, José E. (IEEE, 2022-10-04)
The second IEEE MTT-S Latin America microwave conference [Conference Report]

Rafael-Valdivia, Guillermo; Rayas-Sánchez, José E. (IEEE, 2020-01-01)
The First IEEE MTT-S Latin America Microwave Conference (LAMC-2016)

Rayas-Sánchez, José E.; Ponchak, George E. (IEEE, 2017-09)
Medición de desempeño de procesos de negocios de empresas Pymes mediante la integración y uso de metodologías y herramientas BPM, DWH, y BI. Un caso de estudio de una empresa jalisciense de servicios de mecánica automotriz

Pérez-Ortiz, Humberto (2015-07-07)
Introduction of the IEEE Guadalajara Section Geoscience and Remote Sensing Society Chapter

Villalón-Turrubiates, Iván E. (IEEE, 2014-06)

DESI - Artículos y ponencias sin arbitraje

Browse by

Recent Submissions

Equalization Tuning of the PCIe Physical Layer by Using Machine Learning in Industrial Post-silicon Validation ﻿

PCIe Gen5 Physical Layer Equalization Tuning by Using K-means Clustering and Gaussian Process Regression Modeling in Industrial Post-silicon Validation ﻿

TC-2 Design Automation Committee—On the Future of RF and Microwave Design Automation—2022 ﻿

The MTT-S Education Committee–Promoting education for all–2022 ﻿

The second IEEE MTT-S Latin America microwave conference [Conference Report] ﻿

The First IEEE MTT-S Latin America Microwave Conference (LAMC-2016) ﻿

Medición de desempeño de procesos de negocios de empresas Pymes mediante la integración y uso de metodologías y herramientas BPM, DWH, y BI. Un caso de estudio de una empresa jalisciense de servicios de mecánica automotriz ﻿

Introduction of the IEEE Guadalajara Section Geoscience and Remote Sensing Society Chapter ﻿

Equalization Tuning of the PCIe Physical Layer by Using Machine Learning in Industrial Post-silicon Validation

PCIe Gen5 Physical Layer Equalization Tuning by Using K-means Clustering and Gaussian Process Regression Modeling in Industrial Post-silicon Validation

TC-2 Design Automation Committee—On the Future of RF and Microwave Design Automation—2022

The MTT-S Education Committee–Promoting education for all–2022

The second IEEE MTT-S Latin America microwave conference [Conference Report]

The First IEEE MTT-S Latin America Microwave Conference (LAMC-2016)

Medición de desempeño de procesos de negocios de empresas Pymes mediante la integración y uso de metodologías y herramientas BPM, DWH, y BI. Un caso de estudio de una empresa jalisciense de servicios de mecánica automotriz

Introduction of the IEEE Guadalajara Section Geoscience and Remote Sensing Society Chapter