Yield-driven electromagnetic optimization via space mapping-based neuromodels
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Int. J. RF and Microwave CAE
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Descripción
Accurate yield optimization and statistical analysis of microwave components are crucial ingredients for manufacturability-driven designs in a time-to-market development environment. Yield optimization requires intensive simulations to cover the entire
statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full-wave electromagnetic simulations does not appear feasible. In this article, an efficient procedure to realize electromagnetics (EM) based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. Our technique is illustrated by the EM-based statistical analysis and yield optimization of a high temperature superconducting (HTS) microstrip filter.
Palabras clave
Neural Network Applications, Optimization Methods, Design Automation, Statistical Analysis, Yield Optimization, Design Centering, Microwave Circuits, Microstrip Filters, Neural Modeling, Neural Space Mapping (NSM), Electromagnetic Based Optimization
Citación
J.W. Bandler, J.E. Rayas-Sánchez and Q.J. Zhang, “Yield-driven electromagnetic optimization via space mapping-based neuromodels,” Int. J. RF and Microwave CAE, vol. 12, pp. 79-89, Jan. 2002.