EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping
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Fecha
2006-06
Autores
Rayas-Sánchez, José E.
Gutiérrez-Ayala, Vladimir
Título de la revista
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Editor
IEEE MTT-S International Microwave Symposium
Resumen
Descripción
We propose a method for highly accurate
electromagnetics-based statistical analysis and yield calculations
around a space mapped nominal solution for RF and microwave
circuits. Our method consists of applying a constrained
Broyden-based linear input mapping approach to design,
followed by an output neural mapping modeling process in which
not only the responses but the design parameters and
independent variable are used as inputs to the output neural
network. We illustrate the accuracy of our technique using a
classical synthetic problem.
Palabras clave
Neural Space Mapping (NSM), Electromagnetic Based Design, Broyden-Based Linear Input Mapping, Electromagnetic Based Yield Prediction
Citación
J. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping,” in IEEE MTT-S Int. Microwave Symp. Dig., San Francisco, CA, Jun. 2006, pp. 1597-1600. (ISSN: 0149-645X; E-ISBN: 0-7803-7542-5; P-ISBN: 0-7803-9541-7; INSPEC: 9098190; DOI: 10.1109/MWSYM.2006.249641)