Statistical Design of High Frequency Electronic Circuits Using Space Mapping-Based Neuromodels
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Fecha
2002-04
Autores
Rayas-Sánchez, José E.
Bandler, John W.
Título de la revista
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Editor
VIII International Workshop Iberchip
Resumen
Descripción
Manufacturability-driven designs
in a time-to-market development industrial
environment demand accurate yield
optimization and statistical analysis of the
electronic components. Yield optimization
requires intensive simulations to cover the
entire statistic of possible outcomes of a given
manufacturing process. Full wave electromagnetic
simulations are usually needed to
accurately characterize high frequency
electronic circuits. Performing direct yield
optimization using accurate full wave
electromagnetic simulations for high frequency
circuits does not appear feasible. In
this paper, an efficient procedure to perform
electromagnetics-based yield optimization and
statistical analysis of high frequency
structures using space mapping-based neuromodels
is proposed. Our technique is illustrated
by the EM-based statistical analysis and
yield optimization of an HTS filter.
Palabras clave
Microwave Circuits, Electromagnetic Based Design, Full Wave Electromagnetic Simulations
Citación
J. E. Rayas-Sánchez and J.W. Bandler, “Statistical design of high frequency electronic circuits using space mapping-based neuromodels,” in VIII International Workshop Iberchip (IWS 2002), Guadalajara, Mexico, Apr. 2002.