Impedance matching analysis and EMC validation of a low-cost PCB differential interconnect

dc.contributor.authorBrito-Brito, Zabdiel
dc.contributor.authorRayas-Sánchez, José E.
dc.contributor.authorDelRey, Juan R.
dc.date.accessioned2017-05-11T16:25:00Z
dc.date.issued2015-03
dc.descriptionThis work analyzes a USB differential pair transmission line achieved in an inexpensive standard PCB laminate that is aimed for the Internet of Things ecosystem. An initial simulation in Sonnet EM simulator of the most basic structure is presented, along with a preliminary electromagnetics-based design as well as a basic EMC analysis under the IEC 61000-4-2 standard. In addition, the analysis of a known and well characterized differential structure is presented in order to set its response as a calibration reference. These initial simulations are intended to set the foundations for a more accurate model in a future work.es
dc.description.sponsorshipITESO, A.C.es
dc.description.sponsorshipFreescale Semiconductor Mexico, S de RLes
dc.identifier.citationJ. Rafael del-Rey, Z. Brito-Brito, and J. E. Rayas-Sánchez, “Impedance matching analysis and EMC validation of a low-cost PCB differential interconnect,” in IEEE Latin-American Test Symp. (LATS-2015), Puerto Vallarta, Mexico, Mar. 2015, pp. 1-5. (INSPEC: 15111168, DOI: 10.1109/LATW.2015.7102514).es
dc.identifier.otherDOI: 10.1109/LATW.2015.7102514
dc.identifier.otherINSPEC: 15111168
dc.identifier.urihttp://hdl.handle.net/11117/4487
dc.language.isoenges
dc.publisherIEEE Latin-American Test Symposium (LATS-2015)es
dc.relation.ispartofseriesIEEE Latin-American Test Symposium (LATS-2015);
dc.rights.urihttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-2.5-MX.pdfes
dc.subjectImpedance Matchinges
dc.subjectCoplanares
dc.subjectWaveguide Differentiales
dc.subjectIoTes
dc.titleImpedance matching analysis and EMC validation of a low-cost PCB differential interconnectes
dc.typeinfo:eu-repo/semantics/conferencePaperes
rei.embargo.lift10000-01-01
rei.embargo.termssiemprees
rei.peerreviewedYeses
rei.revisorIEEE Latin-American Test Symposium (LATS-2015)

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