System-Level Measurement-Based Design Optimization by Space Mapping Technology

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dc.contributor.authorRayas-Sánchez, José E.
dc.contributor.authorBandler, John W.
dc.date.accessioned2022-10-21T21:54:22Z
dc.date.available2022-10-21T21:54:22Z
dc.date.issued2022-06-21
dc.descriptionSpace mapping arose from the need to implement fast and accurate design optimization of microwave structures using full-wave EM simulators. Space mapping optimization later proved effective in disciplines well beyond RF and microwave engineering. The underlying coarse and fine models of the optimized structures have been implemented using a variety of EDA tools. More recently, measurement-based physical platforms have also been employed as “fine models.” Most space-mapping-based optimization cases have been demonstrated at the device-, component-, or circuit-level. However, the application of space mapping to high-fidelity system-level design optimization is just emerging. Optimizing highly accurate systems based on physical measurements is particularly challenging, since they are typically subject to statistical fluctuations and varying operating or environmental conditions. Here, we illustrate emerging demonstrations of space mapping system-level measurement-based design optimization in the area of signal integrity for high-speed computer platforms. Other measurement-based space mapping cases are also considered. Unresolved challenges are highlighted and potential general solutions are ventured.es_MX
dc.description.sponsorshipITESO, A.C.es_MX
dc.identifier.citationJ. E. Rayas-Sánchez and J. W. Bandler, “System‐level measurement‐based design optimization by space mapping technology,” in IEEE MTT-S Int. Microwave Symp. Dig., Denver CO, Jun. 2022, pp. 118-120. DOI: 10.1109/IMS37962.2022.9865412es_MX
dc.identifier.isbn978-1-6654-9614-8
dc.identifier.issn0149-645X
dc.identifier.urihttps://hdl.handle.net/11117/8251
dc.language.isoenges_MX
dc.publisherIEEEes_MX
dc.rights.urihttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdfes_MX
dc.subjectBayesianes_MX
dc.subjectBroydenes_MX
dc.subjectDesign Automationes_MX
dc.subjectKriginges_MX
dc.subjectMachine Learninges_MX
dc.subjectOptimizationes_MX
dc.subjectPost-fabrication tuninges_MX
dc.subjectPost-silicon Validationes_MX
dc.subjectSpace Mappinges_MX
dc.subjectSurrogate Modelinges_MX
dc.titleSystem-Level Measurement-Based Design Optimization by Space Mapping Technologyes_MX
dc.typeinfo:eu-repo/semantics/articlees_MX
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones_MX

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