A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple

Abstract

In this paper, we introduce a fast implementation of the CT_EXT algorithm for testor property identification, that is based on an accumulative binary tuple. The fast implementation of the CT_EXT algorithm (one of the fastest algorithms reported), is designed to generate all the typical testers from a training matrix, requiring a reduced number of operations. Experimental results using this fast implementation and the comparison with other state-of-the-art algorithms that generate typical testers are presented.