Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction

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dc.contributor.authorRayas-Sánchez, José E.
dc.date.accessioned2013-05-21T17:03:36Z
dc.date.available2013-05-21T17:03:36Z
dc.date.issued2006-11
dc.descriptionStatistical analysis and yield estimation of high-frequency electronic circuits are critical steps for manufacturability-driven design. Accurate yield prediction typically requires massive amounts of computationally intensive high-fidelity simulations, such as full-wave electromagnetic (EM) simulations, to cover the entire statistic of possible outcomes of a given manufacturing process.es
dc.description.sponsorshipITESO, A.C.es
dc.description.sponsorshipConsejo Nacional de Ciencia y Tecnologíaes
dc.identifier.citationJ. E. Rayas-Sánchez, “Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction,” in Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization (SMSMEO-06), Lyngby, Denmark, Nov. 2006.es
dc.identifier.urihttp://hdl.handle.net/11117/597
dc.language.isoenges
dc.publisherInternational Workshop on Surrogate Modeling and Space Mapping for Engineering Optimizationes
dc.relation.ispartofseriesSecond Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization;2006
dc.rights.urihttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdfes
dc.subjectYield Estimationes
dc.subjectHigh-frequency Electronic Circuitses
dc.subjectElectromagnetic Based Designes
dc.titleLinear-input and neural-output space mapping for highly accurate statistical analysis and yield predictiones
dc.typeinfo:eu-repo/semantics/conferencePaperes
rei.peerreviewedYeses
rei.revisorInternational Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization

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