Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction
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Fecha
2006-11
Autores
Rayas-Sánchez, José E.
Título de la revista
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Editor
International Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization
Resumen
Descripción
Statistical analysis and yield estimation of high-frequency electronic circuits are critical steps for manufacturability-driven design. Accurate yield prediction typically requires massive amounts of computationally intensive high-fidelity simulations, such as full-wave electromagnetic (EM) simulations, to cover the entire statistic of possible outcomes of a given manufacturing process.
Palabras clave
Yield Estimation, High-frequency Electronic Circuits, Electromagnetic Based Design
Citación
J. E. Rayas-Sánchez, “Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction,” in Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization (SMSMEO-06), Lyngby, Denmark, Nov. 2006.