EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect
Cargando...
Fecha
Título de la revista
ISSN de la revista
Título del volumen
Editor
9th IEEE Latin-American Test Workshop
Resumen
Descripción
An electromagnetics (EM)-based parametric
optimization of a microstrip to substrate integrated waveguide
(SIW) transition is described in this work. We study the
waveguide length effects over the reflection coefficient in order to
find a suitable SIW surrogate model. We perform a parametric
optimization of this surrogate model. Finally, we simulate the
original full-length SIW interconnect with microstrip transitions
at the optimal surrogate model solution, confirming a significant
improvement not only in the reflections but also in the
transmission. Both the SIW interconnect and its surrogate model
are simulated using a commercially available full-wave EM
simulator.
Palabras clave
SIW, Hardened Interconnects, Electromagnetic Based Optimization, Parametric Optimization, Microstrip-to-SIW Transitions, Substrate Integrated Waveguide (SIW)
Citación
J. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect,” in 9th IEEE Latin-American Test Workshop (LATW 2008), Puebla, Mexico, Feb. 2008, pp. 145-150.