EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect

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dc.contributor.authorRayas-Sánchez, José E.
dc.contributor.authorGutiérrez-Ayala, Vladimir
dc.date.accessioned2013-05-21T17:56:51Z
dc.date.available2013-05-21T17:56:51Z
dc.date.issued2008-02
dc.descriptionAn electromagnetics (EM)-based parametric optimization of a microstrip to substrate integrated waveguide (SIW) transition is described in this work. We study the waveguide length effects over the reflection coefficient in order to find a suitable SIW surrogate model. We perform a parametric optimization of this surrogate model. Finally, we simulate the original full-length SIW interconnect with microstrip transitions at the optimal surrogate model solution, confirming a significant improvement not only in the reflections but also in the transmission. Both the SIW interconnect and its surrogate model are simulated using a commercially available full-wave EM simulator.es
dc.description.sponsorshipITESO, A.C.es
dc.description.sponsorshipConsejo Nacional de Ciencia y Tecnologíaes
dc.identifier.citationJ. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnect,” in 9th IEEE Latin-American Test Workshop (LATW 2008), Puebla, Mexico, Feb. 2008, pp. 145-150.es
dc.identifier.urihttp://hdl.handle.net/11117/598
dc.language.isoenges
dc.publisher9th IEEE Latin-American Test Workshopes
dc.relation.ispartofseries9th IEEE Latin-American Test Workshop (LATW);2008
dc.rights.urihttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdfes
dc.subjectSIWes
dc.subjectHardened Interconnectses
dc.subjectElectromagnetic Based Optimizationes
dc.subjectParametric Optimizationes
dc.subjectMicrostrip-to-SIW Transitionses
dc.subjectSubstrate Integrated Waveguide (SIW)es
dc.titleEM-based parametric optimization of a transition from microstrip to substrate integrated waveguide interconnectes
dc.typeinfo:eu-repo/semantics/conferencePaperes
rei.peerreviewedYeses
rei.revisor9th IEEE Latin-American Test Workshop

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